Observatorio de I+D+i UPM

Descripción
The presence of spectral lines of bismuth in stellar atmospheres has been reported in different stars. The anomalous values of the spectral intensities of Bi II and Bi III, compared to the theoretical Local Termodinamic Equilibrium (LTE) standards of Bi I/Bi II/Bi III, have been reported in the spectra obtained with theHigh Resolution Spectrograph of the Hubble/Goddard Space Telescope in the chemically peculiar stars HgMn stars ? Lupi and HR 7775. Spectral lines of 1436.8, 1902.3, 2630.9 and 2936.7 Å of Bi II and 1423.4 Å of Bi III were reported and their relative intensities were measured in these studies Litz¿en & Wahlgren 2002. These lines are overlapped with spectral lines of 1437.65, 2630.1 and 2937.1 Å of Bi IV. A study of the Stark broadening parameters of Bi IV spectral lines can help to study these overlaps. In this paper, using the Griem semi-empirical approach, we report calculated values of the Stark parameters for 64 spectral lines of Bi IV. The matrix elements used in these calculations have been determined from 17 configurations of Bi IV. They were calculated using the COWAN code including core polarization effects. Data are displayed for an electron density of 1017 cm?3 and temperatures T = 10 000?160 000 K. Also calculated radiative lifetimes for 12 levels with experimental lifetime are presented, in order to test the goodness of our calculations. Theoretical trends of the Stark width and shift parameters versus the temperature for spectral lines of astrophysical interest are displayed.
Internacional	Si
JCR del ISI	Si
Título de la revista	Monthly Notices of the Royal Astronomical Society
ISSN	0035-8711
Factor de impacto JCR	5,521
Información de impacto	Datos JCR del año 2012
Volumen
DOI	10.1093/mnras/stx1320
Número de revista	470(2)
Desde la página	2179
Hasta la página	2189
Mes	SEPTIEMBRE
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• Autor: Cristobal Colon Hernandez (UPM)
• Autor: Cristina Moreno Diaz (UPM)
• Autor: Maria Isabel de Andres Garcia (UPM)
• Autor: Aurelia Alonso Medina (UPM)

• Creador: Grupo de Investigación: Análisis y Caracterización Óptica de Materiales
• Departamento: Ingeniería Eléctrica, Electrónica Automática y Física Aplicada