Memorias de investigación
Research Publications in journals:
Characterization of Analog Modules: Reliability Analyses of Radiation, Temperature and Variations Effects
Year:2016

Research Areas

Information
Abstract
0
International
Si
JCR
Si
Title
2016 CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS (DCIS 2016)
ISBN
Impact factor JCR
0
Impact info
Volume
Journal number
From page
103
To page
107
Month
Ranking
0
Participants

Research Group, Departaments and Institutes related
  • Creador: No seleccionado
  • Centro o Instituto I+D+i: Centro de I+d+i en Procesado de la Información y Telecomunicaciones
  • Departamento: Ingeniería Electrónica