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Abstract
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| Testing of electrically large, high?gain antennas as well as that of small integrated antennas at millimeter and submillimeter?wavelengths is extremely challenging. Basically, there are three methods for measuring radiation properties of an antenna: the far?field method, the near?field method, and the compact antenna test range (CATR). In case of large antennas, the classical far?field method has two major obstacles at mm and submm wavelengths: impractically large measurement distance and high atmospheric loss. The planar near?field scanning method has been used up to 1 THz. However, the applied near?field methods often give useful information only on the main beam and its vicinity, because the field?sampling is typically very sparse. Reflector?based and hologram?based compact antenna test range (CATR) measurements have been demonstrated up to 500 GHz and 650 GHz, respectively. In case of small integrated antennas, various techniques for on?wafer measurements have been developed. This chapter discusses the theory, techniques and limitations of the various test methods ? the far?field method, planar near?field scanning and CATR as well as on?wafer measurements. Also, antenna pattern correction techniques are discussed. | |
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International
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Si |
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Book Edition
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Book Publishing
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ISBN
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978-3-319-62772-4 |
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Series
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Book title
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Aperture Antennas at Millimeter and Submillimeter Wave Applications |
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From page
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409 |
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To page
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450 |