Observatorio de I+D+i UPM

Descripción
Variability and degradation in RRAM devices involve complex physical mechanisms that depend on the device, environment and programming/read operation. The development of solid and accurate compact models, ready to be used in standard circuit simulators, requires the meticulous emulation of this kind of non-ideal effects. In this work we present an advanced approach for the emulation of complex variability and degradation effects in SPICE compacts models. Without requiring compiled components - such as Verilog-A or CMI code - the proposed solution can be adapted to any kind of memristor model providing full support to the emulation of these intricate behaviors. Thorough experiments illustrate the capabilities of the presented approach. There, we make use of a physical SPICE model that emulates behavioral dependence on the device cycling, simulation time and stress levels. After applying the proposed techniques, we obtain an enhanced model properly aware of the device's non-ideal behavior.
Internacional	Si
Nombre congreso	14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2017
Tipo de participación	960
Lugar del congreso	Taormina, Italia
Revisores	Si
ISBN o ISSN	978-1-5090-5052-9
DOI	10.1109/SMACD.2017.7981597
Fecha inicio congreso	12/06/2017
Fecha fin congreso	15/06/2017
Desde la página	1
Hasta la página	4
Título de las actas	14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2017

Esta actividad pertenece a memorias de investigación

• Autor: Fernando Garcia Redondo (UPM)
• Autor: M. Luisa Lopez Vallejo (UPM)
• Autor: Carlos Alberto Lopez Barrio (UPM)

• Creador: Grupo de Investigación: Laboratorio de Sistemas Integrados (LSI)
• Centro o Instituto I+D+i: Centro de I+d+i en Procesado de la Información y Telecomunicaciones
• Departamento: Ingeniería Electrónica