Memorias de investigación
Research Publications in journals:
Bayesian model for subpixel uncertainty determination in optical measurements
Year:2017

Research Areas

Information
Abstract
0
International
Si
JCR
Si
Title
MANUFACTURING ENGINEERING SOCIETY INTERNATIONAL CONFERENCE 2017 (MESIC 2017)
ISBN
2351-9789
Impact factor JCR
0
Impact info
Volume
13
10.1016/j.promfg.2017.09.042
Journal number
From page
442
To page
449
Month
Ranking
0
Participants

Research Group, Departaments and Institutes related
  • Creador: No seleccionado
  • Departamento: Física Aplicada e Ingeniería de Materiales