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Descripción
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| This article presents a specific procedure to control the STC power in PV modules. It also shows the results of its application on a supply of approximately 700,000 multicrystalline p-type silicon BSF technology photovoltaic modules made by a worldwide known manufacturer (Tier-1, Q4 2015). First, during the manufacturing process, the analysis of the STC power measurements of the whole supply carried out by the modules' manufacturer is included, where the quality of these measurements was evaluated through a comparative contrast study in an independent laboratory on a sample of 4,000 modules. In addition, the LID on 180 modules and the resistance to the PID in a sample of 125 modules were characterized and critically analysed. Secondly, during the operation phase, the analysis of the STC power after the first 2 years of operation of the modules in desert conditions was also included. These measurements were carried out on a sample of 2,000 modules making use of an accredited mobile laboratory. The overall results showed the effectiveness of the implementation of the aforementioned procedure, which is based on the use of a set of reference modules (primary standards) with common calibration origin. It proved to be an effective way of reducing uncertainties all along the quality control process. The susceptibility to PID, as observed on the PID test (chamber method) specified in IEC TS 62804, was practically negligible and the average LID degradation after 20 kWh/m2 of exposition to the sun was 1.5%. Finally, the degradation rate in the second year of operation is 0.32% with respect to the initial degradation occurred during the whole first year. | |
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Internacional
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Si |
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JCR del ISI
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Si |
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Título de la revista
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Progress in Photovoltaics |
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ISSN
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1062-7995 |
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Factor de impacto JCR
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6,456 |
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Información de impacto
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Datos JCR del año 2017 |
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Volumen
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10 |
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DOI
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10.1002/pip.3174 |
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Número de revista
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