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Abstract
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|---|---|
| Application of OBIA & LiDAR to create exposure and vulnerability databases | |
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International
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No |
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Congress
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II Simposio -Cuéntanos tu tesis en 4 minutos- UPM |
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960 |
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Place
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Madrid |
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Reviewers
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Si |
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ISBN/ISSN
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00-000-000-00 |
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Start Date
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14/03/2018 |
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End Date
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16/03/2018 |
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From page
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0 |
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To page
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0 |
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0 |