Descripción
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This work proposes the application of different quasi-analytical field-matching formulations for the problem of characterizing a dielectric material layer to be measured between two coaxial ports. The development of these different formulations allows for an easy and computationally affordable wide-band modeling of different parameters of interest, as for example the radius of the flange used to support the material under measurement. Numerical results will be provided and compared with other techniques. | |
Internacional
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Si |
Nombre congreso
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Joint International Symposium on Electromagnetic Compability and Asia-Pacific International Symposiymum on Electromagnetic Compability, |
Tipo de participación
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960 |
Lugar del congreso
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Hokkaido (Japón) |
Revisores
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Si |
ISBN o ISSN
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CDP08UPM |
DOI
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Fecha inicio congreso
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03/06/2019 |
Fecha fin congreso
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07/06/2019 |
Desde la página
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1 |
Hasta la página
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1 |
Título de las actas
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Proceedings of "Joint International Symposium on Electromagnetic Compability and Asia-Pacific International Symposiymum on Electromagnetic Compability" |