Memorias de investigación
Research Publications in journals:
Combined assessment of Al1-xScxN thin films by RBS, XRD, FTIR and BAW frequency response measurements
Year:2019
Research Areas
Information
Abstract
0
International
Si
JCR
Si
Title
2019 IEEE INTERNATIONAL ULTRASONICS SYMPOSIUM (IUS)
ISBN
1948-5719
Impact factor JCR
0
Impact info
Volume
Journal number
From page
720
To page
723
Month
Ranking
0
Participants
Research Group, Departaments and Institutes related
  • Creador: No seleccionado
  • Departamento: Ingeniería Electrónica
  • Centro o Instituto I+D+i: Centro de Materiales y Dispositivos Avanzados para Tecnologías de Información y Comunicaciones