Research Publications in journals:
Fabrication and stress relief modelling of GaN based MEMS test structures grown by MBE on Si(111)
Year:2008
Research Areas
- Electronics engineering
Information
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Abstract
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|---|---|
| RELACIONADO CON LINEA DE INVESTIGACION | |
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International
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Si |
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JCR
|
Si |
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Title
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PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS |
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ISBN
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0370-1972 |
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Impact factor JCR
|
1,071 |
|
Impact info
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|
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Volume
|
5 |
|
|
|
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Journal number
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0 |
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From page
|
1974 |
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To page
|
1976 |
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Month
|
ENERO |
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Ranking
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Open Access publication
Participants
- Autor: Eugenio Sillero Herrero UPM
- Autor: Miguel Angel Sanchez Garcia UPM
- Autor: Ana Mª Bengoechea Encabo UPM
- Autor: David Lopez-Romero Moraleda UPM
- Autor: Fernando Calle Gomez UPM
Research Group, Departaments and Institutes related
- Creador: Grupo de Investigación: Grupo de Dispositivos Semiconductores del ISOM
- Centro o Instituto I+D+i: Instituto Universitario de Sistemas Optoelectrónicos y Microtecnología
- Departamento: Ingeniería Electrónica