Abstract
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RELACIONADO CON LINEA DE INVESTIGACION DEL GRUPO | |
International
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Si |
Congress
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International workshop on nitrides Semiconductors 2008, 6-10 de Octubre 2008 Montreux, (Suiza), 2008 |
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960 |
Place
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Montreux, (Suiza), 2008 |
Reviewers
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Si |
ISBN/ISSN
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0000-0000 |
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Start Date
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06/10/2008 |
End Date
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10/10/2008 |
From page
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0 |
To page
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0 |
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In-situ GaN decomposition analysis by quadrupole mass spectrometry and reflection high-energy electron diffraction |