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Abstract
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| RELACIONADO CON LINEA DE INVESTIGACION DEL GRUPO | |
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International
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Si |
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Congress
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International workshop on nitrides Semiconductors 2008, 6-10 de Octubre 2008 Montreux, (Suiza), 2008 |
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960 |
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Place
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Montreux, (Suiza), 2008 |
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Reviewers
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Si |
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ISBN/ISSN
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0000-0000 |
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Start Date
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06/10/2008 |
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End Date
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10/10/2008 |
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From page
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0 |
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To page
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0 |
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In-situ GaN decomposition analysis by quadrupole mass spectrometry and reflection high-energy electron diffraction |