Descripción
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Reliability evaluation based on degradation is very useful in systems with scarce failures. In this paper a new degradation model based on Weibull distribution is proposed. The model is applied to the degradation of Light Emitting Diodes (LEDs) under different accelerated tests. The results of these tests are in agreement with the proposed model and reliability function is evaluated. | |
Internacional
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Si |
Nombre congreso
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Safety, Reliability and Risk Analysis, ESREL, 2008 and SRA-Europe |
Tipo de participación
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960 |
Lugar del congreso
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Valencia (España) |
Revisores
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Si |
ISBN o ISSN
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978-0-415-48513-5 |
DOI
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Fecha inicio congreso
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22/09/2008 |
Fecha fin congreso
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25/09/2008 |
Desde la página
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899 |
Hasta la página
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904 |
Título de las actas
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2009 Taylor & Francis Group, London |