Observatorio de I+D+i UPM

Memorias de investigación
Artículos en revistas:
Structural stability of SiGe nanoparticles under "in situ" electron beam irradiation in TEM
Año:2008
Áreas de investigación
  • Industria electrónica
Datos
Descripción
The structure of amorphous and crystalline SiGe nanoparticles, embedded in a dielectric medium, SiO2, and its stability under ¿in situ¿ electron beam irradiation is reported. High-resolution transmission electron microscopy and electron-diffraction pattern simulation by fast Fourier transform was used to analyze the crystal structure of the SiGe nanoparticles. Electron beam irradiation induces structural alternate order-disorder transitions in the nanoparticles for irradiation effects are mainly associated to the density of current. For irradiation with current densities < 7 A·cm-2 no effects are observed in the as-deposited amorphous samples, whereas in the crystallized samples, SiGe nanocrystals show higher stability and no effects are observed for irradiation densities of current < 50 A·cm-2. Irradiation with densities of current greater than these thresholds cause consecutive amorphous-crystalline or crystalline-amorphous structure transitions respectively for both amorphous and crystallized nanoparticles. A hexagonal structure is proposed for those nanocrystals obtained after irradiation in the as deposited amorphous samples.
Internacional
Si
JCR del ISI
Si
Título de la revista
ISSN
Factor de impacto JCR
0
Información de impacto
Volumen
126
DOI
10.1088/1742-6596
Número de revista
0
Desde la página
012023
Hasta la página
012027
Mes
ENERO
Ranking
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Participantes
  • Participante: C Ballesteros (Universidad Carlos III de Madrid)
  • Participante: C Kanyinda-Malu
  • Autor: Andres Rodriguez Dominguez (UPM)
  • Autor: Jesus Sangrador Garcia (UPM)
  • Participante: M.I. Ortiz
  • Autor: Tomas Rodriguez Rodriguez (UPM)
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Departamento: Tecnología Electrónica
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