Observatorio de I+D+i UPM

Descripción
Pattern matching and image patches correspondence have been described in several papers. However, in most cases the results are obtained using images with high level of detail, in other words, images with useful edge information. This paper describes a method to find correspondences between images with very poor edge information -for instance a painting with a cloudless sky- and its application to reflectographic images mosaicing. Unlike other pattern matching techniques, the proposed method solves the issue of low levels of detail or lack of good information, both needed for the determination of the correspondences used by common likeness measure (cross-norm correlation), features correspondence (Harris, SUSAN) and object recognition methods. Thus, intensity-augmented ordinal measure method is used: a window-based noise-robust method to calculate matching points. This method is improved with our Point Structure Selection (PSS) procedure to select good correspondences and reject false positives.
Internacional	Si
Nombre congreso	ICIP 2009 IEEE International Conference on Image Processing
Tipo de participación	960
Lugar del congreso	El Cairo
Revisores	Si
ISBN o ISSN	978-1-4244-5653-6
DOI	10.1109/ICIP.2009.5414221
Fecha inicio congreso	07/10/2009
Fecha fin congreso	10/10/2009
Desde la página	197
Hasta la página	200
Título de las actas	Matching Points in Poor Edge Information Images

Esta actividad pertenece a memorias de investigación

• Autor: Alberto Posse Fernández (UPM)
• Autor: Juan Torres Arjona (UPM)
• Autor: Jose Manuel Menendez Garcia (UPM)

• Creador: Grupo de Investigación: Grupo de Aplicación de Telecomunicaciones Visuales (G@TV)
• Departamento: Señales, Sistemas y Radiocomunicaciones