Observatorio de I+D+i UPM

Memorias de investigación
Ponencias en congresos:
Nonlinear Diffusion Filters without Parameters for Image Segmentation
Año:2009
Áreas de investigación
  • Matemáticas,
  • Automática
Datos
Descripción
Nonlinear diffusion filtering seeks to improve images qualitatively by removing noise while preserving details and even enhancing edges. However, well known implementations are sensitive to parameters which are necessarily tuned to sharpen a narrow range of edge slopes. In this work, we have selected a nonlinear diffusion filter without control parameters. It has been guided searching the optimum balance between time performance and resulting quality suitable for automatic segmentation tasks. Using a semi-implicit numerical scheme, we have determined the relationship between the slope range to sharpen and the diffusion time. It has also been selected the diffusivity with optimum performances. Several diffusion filters have been applied to noisy computed tomography images and evaluated for their suitability to the medical image segmentation. Experimental results show that our proposal of filter performs quite well in relation to others.
Internacional
Si
Nombre congreso
Computer Analysis of Images and Patterns, 13th International Conference, CAIP 2009
Tipo de participación
960
Lugar del congreso
Münster, Germany
Revisores
Si
ISBN o ISSN
978-3-642-03766-5
DOI
10.1007/978-3-642-03767-2_63
Fecha inicio congreso
02/09/2009
Fecha fin congreso
04/09/2009
Desde la página
517
Hasta la página
524
Título de las actas
Computer Analysis of Images and Patterns, 13th International Conference, LNCS, Volume 5702/2009
Esta actividad pertenece a memorias de investigación
Participantes
  • Autor: Carlos Platero Dueñas (UPM)
  • Autor: Fco. Javier Sanguino Botella (UPM)
  • Autor: Olga Velasco Manuel (UPM)
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Bioingeniería Aplicada
  • Departamento: Electrónica, Automática e Informática Industrial
  • Departamento: Matemática Aplicada (E.U.I.T. Industrial)
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