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Memorias de investigación
Artículos en revistas:
Compositional analysis and evolution of defects formed on GaInP epilayers grown on Germanium
Año:2009
Áreas de investigación
  • Industria electrónica
Datos
Descripción
In this work, a compositional and morphological study of GaInP layers grown on Ge substrates is presented. The samples have been evaluated by means of high resolution X-ray diffraction, Rutherford backscattering channeling, atomic force microscopy and scanning electron microscopy. Compositional results from HRXRD and RBS show that the quality of samples close to the lattice match are independent on the composition (Ga or In-rich), although for Ga-rich samples, the spectra from RBS channeling measurements is not equal for one h110i direction and its perpendicular, an effect that does not appear in In-rich samples. Concerning, the morphological results, two typical defects appear on GaInP nucleation layer on Ge substrate  the so called arrowhead defects and asymmetric truncated pyramids  both orientated along h110i directions. Experiments reveal that the formation of pyramids is independent on the layer composition, while the density of arrowheads increases as the layer gets more Ga-rich.
Internacional
Si
JCR del ISI
Si
Título de la revista
SUPERLATTICES AND MICROSTRUCTURES
ISSN
0749-6036
Factor de impacto JCR
1,211
Información de impacto
Volumen
45
DOI
Número de revista
0
Desde la página
277
Hasta la página
284
Mes
ABRIL
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Participantes
  • Participante: B. Galiana (Instituto de Energía Solar)
  • Participante: E. Alves (InstitutoTécnico y Nuclear - Lisboa)
  • Participante: V. Corregidor (InstitutoTécnico y Nuclear - Lisboa)
  • Autor: Enrique Barrigon Montañes (UPM)
  • Autor: Ignacio Rey-Stolle Prado (UPM)
  • Autor: Pilar Espinet González (UPM)
  • Autor: Carlos Algora Del Valle (UPM)
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Semiconductores III-V
  • Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física
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