Abstract
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Relacionado con Línea de Investigación del Grupo GDS-ISOM, consultar en http://www.isom.upm.es/invdes.php | |
International
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Si |
Congress
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19th International Conference on Ion Beam Analyis Cambridge (UK), 2009 |
|
960 |
Place
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Cambridge (UK), 2009 |
Reviewers
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Si |
ISBN/ISSN
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0000000000000 |
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Start Date
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07/09/2009 |
End Date
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11/09/2009 |
From page
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0 |
To page
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0 |
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"Accurate measurement of strain in semiconductors heterostructures by high-energy ion channelling: the influence of steering effects" |