Memorias de investigación
Communications at congresses:
A. REDONDO-CUBERO, K. LORENZ, N. FRANCO, S. FERNÁNDEZ-GARRIDO, R. GAGO, P. J. M. SMULDERS, E. MUÑOZ, E. CALLEJA, I. M. WATSON, E. ALVES "Accurate measurement of strain in semiconductors heterostructures by high-energy ion channelling: the influence of steering effects" 19th International Conference on Ion Beam Analyis Cambridge (UK), 2009
Year:2009
Research Areas
  • Electronics engineering
Information
Abstract
Relacionado con Línea de Investigación del Grupo GDS-ISOM, consultar en http://www.isom.upm.es/invdes.php
International
Si
Congress
19th International Conference on Ion Beam Analyis Cambridge (UK), 2009
960
Place
Cambridge (UK), 2009
Reviewers
Si
ISBN/ISSN
0000000000000
Start Date
07/09/2009
End Date
11/09/2009
From page
0
To page
0
"Accurate measurement of strain in semiconductors heterostructures by high-energy ion channelling: the influence of steering effects"
Participants
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Grupo de Dispositivos Semiconductores del ISOM
  • Centro o Instituto I+D+i: Instituto Universitario de Sistemas Optoelectrónicos y Microtecnología
  • Departamento: Ingeniería Electrónica