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Descripción
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| We have recently shown that thermal noise in the space-charge regions of solid-state devices can account for most of their excess noise, whose 1/f spectrum is produced by the dc bias that was used to convert resistance noise into a voltage noise to be measured. This spectrum reflects the modulation of an energy barrier that confines carriers along the channel of such devices ¿a feature that was also found for electrons around cathodes of vacuum tubes. Using this novel theory, we can predict a flicker noise in vacuum tubes¿a noise whose origin has eluded scientists since its early report by Johnson in 1925. | |
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Internacional
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Si |
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JCR del ISI
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Si |
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Título de la revista
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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT |
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ISSN
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0018-9456 |
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Factor de impacto JCR
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0,978 |
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Información de impacto
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Volumen
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58 |
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DOI
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Número de revista
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10 |
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Desde la página
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3592 |
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Hasta la página
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3601 |
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Mes
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ENERO |
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Ranking
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