Memorias de investigación
Research Publications in journals:
Evaluation of AlGaInP LEDs reliability based on accelerated tests
Year:2009

Research Areas
  • Electronics engineering

Information
Abstract
High efficiency LEDs are replacing incandescent bulbs in many applications particularly those requiring durability and low power consumption. In some of these applications, as automotive and traffic signals, LEDs work in outdoor environment and in some cases in extreme temperature and humidity conditions. Main failure mechanisms have been identified for the different stress conditions (temperature/humidity accelerated tests). MTTF of 127,000 h have been evaluated for real working conditions by means of applying Arrhenius and Peck model values obtained in this paper.
International
Si
JCR
Si
Title
MICROELECTRONICS RELIABILITY
ISBN
0026-2714
Impact factor JCR
1,29
Impact info
Volume
49
Journal number
0
From page
1240
To page
1243
Month
SEPTIEMBRE
Ranking
Participants

Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Semiconductores III-V
  • Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física