Memorias de investigación
Ponencias en congresos:
A Double Classification of Common Pitfalls in Ontologies
Año:2010

Áreas de investigación
  • Inteligencia artificial

Datos
Descripción
The application of methodologies for building ontologies has improved the ontology quality. However, such a quality is not totally guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or worst practices in the modelling. In this context, our aim in this paper is twofold: (1) to provide a catalogue of common worst practices, which we call pitfalls, and (2) to present a double classification of such pitfalls. These two products will serve in the ontology development in two ways: (a) to avoid the appearance of pitfalls in the ontology modelling, and (b) to evaluate and correct ontologies to improve their quality.
Internacional
Si
Nombre congreso
Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010
Tipo de participación
960
Lugar del congreso
Lisbon,Portugal
Revisores
Si
ISBN o ISSN
1613-0073
DOI
Fecha inicio congreso
15/10/2010
Fecha fin congreso
15/10/2010
Desde la página
1
Hasta la página
12
Título de las actas
Proceedings of Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010

Esta actividad pertenece a memorias de investigación

Participantes

Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Ontology Engineering Group (LIA). Laboratorio Inteligencia Artificial. Grupo de Ingeniería Ontológica