Observatorio de I+D+i UPM

Descripción
As discharge duration increases, real-time complex analysis of the signal becomes more important. In this context, data acquisition and processing systems must provide models for designing experiments which use event oriented plasma control. One example of advanced data analysis is signal classification. The off-line statistical analysis of a large number of discharges provides information to develop algorithms for the determination of the plasma parameters from measurements of magnetohydrodinamic waves, for example, to detect density fluctuations induced by the Alfvén cascades using morphological patterns. The need to apply different algorithms to the signals and to address different processing algorithms using the previous results necessitates the use of an event-based experiment. The Intelligent Test and Measurement System platform is an example of architecture designed to implement distributed data acquisition and real-time processing systems. The processing algorithm sequence is modeled using an event-based paradigm. The adaptive capacity of this model is based on the logic defined by the use of state machines in SCXML. The Intelligent Test and Measurement System platform mixes a local multiprocessing model with a distributed deployment of services based on Jini.
Internacional	Si
JCR del ISI	Si
Título de la revista	REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN	0034-6748
Factor de impacto JCR	1,521
Información de impacto
Volumen	81
DOI	10.1063/1.3494273
Número de revista	10
Desde la página	10E126
Hasta la página	10E126
Mes	OCTUBRE
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Esta actividad pertenece a memorias de investigación

• Autor: Mariano Ruiz Gonzalez (UPM)
• Autor: Guillermo de Arcas Castro (UPM)
• Autor: Eduardo Barrera Lopez de Turiso (UPM)
• Autor: Juan Manuel Lopez Navarro (UPM)

• Creador: Grupo de Investigación: Investigación en Instrumentación y Acústica Aplicada (I2A2)
• Centro o Instituto I+D+i: Centro de Acústica Aplicada y Evaluación No Destructiva (CAEND). Centro Mixto UPM-CSIC
• Departamento: Sistemas Electrónicos y de Control