Abstract
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The O-doped ZnTe (ZnTe1-xOx) alloys present induce levels through O doping into the host semiconductor gap. ZnTe usually crystallizes in the zinc-blend structure and ZnO in the wurtzite structure under normal conditions. Therefore two possible ZnTe1-xOx phases may coexist, although in different proportions, depending on experimental growth conditions. We present total energy calculations and analyze some of their electronic properties with respect to: the two ordered wurtzite and zinc-blende structures, the concentration (x from 0.0078 to 0.5), the localized basis set (from single-zeta to quadruple-zeta with polarization basis sets), and the variation of the ionization levels with x and with the distance O-Zn. (C) 2010 Elsevier B.V. All rights reserved. | |
International
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Si |
JCR
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Si |
Title
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COMPUTATIONAL MATERIALS SCIENCE |
ISBN
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0927-0256 |
Impact factor JCR
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1,522 |
Impact info
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Volume
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49 |
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Journal number
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From page
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368 |
To page
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371 |
Month
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AGOSTO |
Ranking
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