Memorias de investigación
Research Publications in journals:
Degradation of AlInGap red LEDs under drive current and temperature accelerated life tests
Year:2010
Research Areas
  • Electronic technology and of the communications
Information
Abstract
AlInGaP LEDs are widely used in illumination applications as automotive and signalization due their low consumption and high durability. In order to verify the high durability data it is necessary to consider not only catastrophic failures but also degradation. In this work LEDs degradation at different temperature and drive current accelerated tests have been analyzed. In all the tests we have carried out an exponential degradation trend have been observed. Temperature and drive current influence in degradation rate and reliability have been evaluated.
International
Si
JCR
Si
Title
MICROELECTRONICS RELIABILITY
ISBN
0026-2714
Impact factor JCR
1,117
Impact info
Volume
50
Journal number
From page
1559
To page
1562
Month
SEPTIEMBRE
Ranking
Participants
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Semiconductores III-V
  • Centro o Instituto I+D+i: Instituto de Energía Solar