Communications at congresses:
Capacitance measurements for subcell characterization in multijunction solar cells
Year:2010
Research Areas
- Electronic technology and of the communications
Information
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Abstract
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| On this paper we present an alternative way to analyze de electronic properties of each subcell from the complete device. By illuminating the cell with light sources which energy is near one of the subcell bandgaps, it is possible to ¿erase¿ the presence of such subcell on the CV curve. The main advantages of this technique are that it is not destructive, it can be measured on the complete cell so can be easily implemented as a diagnostic technique for controlling electronic deviations. | |
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International
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Si |
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Congress
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35th IEEE Photovoltaic Specialists Conference |
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960 |
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Place
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Honolulu (Hawaii) |
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Reviewers
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Si |
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ISBN/ISSN
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978-1-4244-5891-2 |
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Start Date
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20/06/2010 |
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End Date
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25/06/2010 |
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From page
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708 |
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To page
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711 |
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35th IEEE Photovoltaic Specialists Conference |
Open Access publication
Participants
- Autor: C.M. Ruiz
- Autor: Ignacio Rey-Stolle Prado UPM
- Autor: V. Bermudez
- Autor: Ivan Garcia Vara UPM
- Autor: Enrique Barrigon Montañes UPM
- Autor: Pilar Espinet González UPM
- Autor: Carlos Algora Del Valle UPM
Research Group, Departaments and Institutes related
- Creador: Grupo de Investigación: Semiconductores III-V
- Centro o Instituto I+D+i: Instituto de Energía Solar