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Abstract
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| FLAW DETECTION ON HIGHLY SCATTERING MATERIALS USING MULTIRESOLUTION ANALYSIS WITH TIME-FRECUENCY THERESHOLDING | |
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International
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No |
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Congress
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ICA 2007 |
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960 |
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Place
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MADRID (ESPAÑA) |
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Reviewers
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No |
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ISBN/ISSN
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84-87985-12-2 |
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Start Date
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02/09/2007 |
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End Date
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07/09/2007 |
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From page
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To page
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