Memorias de investigación
Research Publications in journals:
Volume charge carrier number fluctuations probed by low frequency noise measurements in InN layers
Year:2011

Research Areas

Information
Abstract
International
Si
JCR
Si
Title
APPLIED PHYSICS LETTERS
ISBN
0003-6951
Impact factor JCR
3,82
Impact info
Volume
98
10.1063/1.3601855
Journal number
25
From page
0
To page
3
Month
Ranking
14/116 PHYSICS, APPLIED (SCI)
Participants
  • Autor: geeta rani mutta
  • Autor: jean marc routoure
  • Autor: bruno guillet
  • Autor: laurence mechin
  • Autor: javier grandal UPM
  • Autor: sara martin-horcajo UPM
  • Autor: tommaso brazzini UPM
  • Autor: fernando calle UPM
  • Autor: miguel a. sanchez-garcia UPM
  • Autor: philippe marie
  • Autor: pierre ruterana

Research Group, Departaments and Institutes related
  • Centro o Instituto I+D+i: Instituto Universitario de Sistemas Optoelectrónicos y Microtecnología
  • Grupo de Investigación: Grupo de Dispositivos Semiconductores del ISOM
  • Departamento: Ingeniería Electrónica