{"id":10353,"date":"2022-07-27T12:36:29","date_gmt":"2022-07-27T10:36:29","guid":{"rendered":"https:\/\/www.upm.es\/recursosidi\/offers-resources\/sin categor\u00eda\/thickness-measurement-and-optical-profiling-of-thin-films\/"},"modified":"2022-07-27T12:36:31","modified_gmt":"2022-07-27T10:36:31","slug":"thickness-measurement-and-optical-profiling-of-thin-films","status":"publish","type":"product","link":"https:\/\/www.upm.es\/recursosidi\/en\/offers-resources\/technological-scientific-services\/services-technological-scientific-services\/thickness-measurement-and-optical-profiling-of-thin-films\/","title":{"rendered":"Thickness measurement and optical profiling of thin films"},"content":{"rendered":"

Scientific and technology services<\/h2>\n

Thickness measurement and optical profiling of thin films
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Description of the services offered
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Micro and nanometric thickness measurement using thin film reflectance spectra. At the same time, profiling the refractive index of the material forming the film.<\/p>\n

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Needs requested and applications<\/h4>\n

Many applications using thin films require specific thicknesses, which is why it is essential to profile them. At the same time, calculating an unknown material’s refractive index can give information about it, and also serve for profiling and optical simulations that need to be carried out on the material.<\/p>\n

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Sector or area of application<\/h4>\n

Micro and nano production. Optical profiling.<\/p>\n

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Differential skills<\/h4>\n

The equipment used for this service give highly competitive precision measurement, when compared to that available on the market. Furthermore, due to the use of microscope objective lenses, if is possible to measure micrometric areas.<\/p>\n

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Equipment description<\/h4>\n

The facilities have different equipment for thin film optical profiling. From the simplest to the most sophisticated. One or the other is offered, depending on the applicant.<\/p>\n

\n Dispersive spectrometer<\/strong>: F20-UV, made by Filmetrics, which is capable of measuring semi-transparent film thicknesses of up to 20 \u00bfm in reflection. In this case, the spectral window covered is 200 to 1,100 nm, as Filmetrics uses two lamps at the same time \u00bfone is deuterium and the other is halogen. The equipment’s resolution is 1 nm and the diameter of the beam in the measurement can be 200 \u00bfm or 2 mm. The measurements are processed using the FilMeasure proprietary system, using measuring formulae depending on the type of measurement to be carried out.<\/p>\n