|
Descripción
|
|
|---|---|
| New measuring systems provide abundant spatial information and offer significant advantages in many applications in the field of aerospace, automotive, reverse engineering, deformations control, etc. The use of some or other systems will depend on requirements that work or project demands, but in all cases, the measurement systems must regularly have a metrological checking in order to estimate measurement uncertainty and assured its traceability. | |
|
Internacional
|
Si |
|
JCR del ISI
|
No |
|
Título de la revista
|
American Institute of Physics |
|
ISSN
|
1551-7616 |
|
Factor de impacto JCR
|
|
|
Información de impacto
|
|
|
Volumen
|
1431 |
|
DOI
|
|
|
Número de revista
|
|
|
Desde la página
|
267 |
|
Hasta la página
|
274 |
|
Mes
|
SIN MES |
|
Ranking
|
|