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Memorias de investigación
Communications at congresses:
Structural stability of SiGe nanoparticles under "in situ" electron beam irradiation in TEM
Year:2007
Research Areas
  • Electronics engineering
Information
Abstract
The structure of amorphous and crystalline SiGe nanoparticles, embedded in a dielectric medium, SiO2, and its stability under ¿in situ¿ electron beam irradiation is reported. High-resolution transmission electron microscopy and electron-diffraction pattern simulation by fast Fourier transform was used to analyze the crystal structure of the SiGe nanoparticles. Electron beam irradiation induces structural alternate order-disorder transitions in the nanoparticles. Irradiation effects are mainly associated to the electron beam flux. For irradiation flux <7 A¿cm-2 no effects are observed in the as-deposited amorphous samples, whereas in the crystallized samples, SiGe nanocrystals shows higher stability and no effects are observed for irradiation flux <50 A¿cm-2. Irradiation fluxes greater than these thresholds cause consecutive amorphous-crystalline or crystalline-amorphous structure transitions respectively for both amorphous and crystallized nanoparticles. A hexagonal structure is proposed for those nanocrystals obtained after irradiation in the as deposited amorphous samples.
International
Si
Congress
Instute of Physics. Electron Microscopy and Analysis Groùp Conference 2007
960
Place
Glasgow, Reino Unido
Reviewers
Si
ISBN/ISSN
Start Date
03/09/2007
End Date
07/09/2007
From page
To page
Participants
  • Participante: C Ballesteros (Universidad Carlos III de Madrid)
  • Participante: C Kasnyinda-Malu
  • Autor: Tomas Rodriguez Rodriguez (UPM)
  • Autor: Andres Rodriguez Dominguez (UPM)
  • Participante: M I Ortiz
  • Autor: Jesus Sangrador Garcia (UPM)
Research Group, Departaments and Institutes related
  • Creador: Departamento: Tecnología Electrónica
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