Descripción
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In this work, we focus on a rapid and reliable frequency-parameter sweep in microwave circuits based on the reduced-basis method. We pay special attention to come up with a formulation dropping singularities in frequency out of the Maxwell operator. The proposed model order reduction is based upon the following observation: should the ?eld solution of the original system be considered as a function of frequency, the ?eld solution itself does not arbitrarily vary as frequency changes, but it varies smoothly with frequency, i.e., the ?eld solution resides on a very low dimensional subspace induced by the frequency variation. This observation is a direct consequence of the fact that the Maxwell operator as well as the forcing term are smooth functions of frequency. The reduced-basis method focuses on approximating the evolution of the electromagnetic ?eld as a function of frequency, rather than approximating the electromagnetic ?eld itself as the FEM does. We propose a model order reduction approach where ?eld solutions at dierent frequencies are used as new basis functions to capture the dynamics of the electromagnetic ?eld as frequency changes. Galerkin projection is applied to reduce the original FEM system into a small system detailing the frequency behavior of the original problem. Thus, the frequency response of the structure under analysis can be obtained with ease. Nevertheless, we still need to solve the large original problem at speci?c frequencies to get the reduced basis functions. In this work, we pay special attention to adaptively select those ?eld solution frequency samples that give rise to a robust reduced basis approximation space. In addition, the accuracy of the reduced-order model is certi?ed by means of the residual error of the reduced ?eld solution throughout the whole frequency band of interest. As a result, a fully automatic and completely reliable model order reduction process is achieved. | |
Internacional
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Si |
ISSN o ISBN
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Entidad relacionada
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1th International Workshop on Finite Elements for Microwave Engineering |
Nacionalidad Entidad
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E.E.U.U. DE AMERICA |
Lugar del congreso
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