Observatorio de I+D+i UPM

Memorias de investigación
Communications at congresses:
Analysis of thermo-mechanical stress effects on CPV receiver under high intensity light cycles
Year:2014
Research Areas
  • Solar cells,
  • Technology of devices for engineering
Information
Abstract
External quantum efficiency measurement of multijunction solar cells is not an easy task. In this paper we propose to trace the I-V curve of the multijunction device under the same light bias conditions intended to be applied for the EQE measurement as an effective way to minimize artifacts and determine the optimum light and voltage bias conditions for the measurement. In this way, the analysis of the I-V curve will help to determine the proper voltage bias needed (if any), as well as to distinguish whether the external quantum efficiency measurement is being affected by shunt problems, early breakdown or luminescent coupling. This is of special relevance in order to determine the origin of the measurement artifact affecting the external quantum efficiency measurement of MJSCs.
International
Si
Congress
40th IEEE Photovoltaic Specialists Conference
960
Place
Denver, CO (EEUU)
Reviewers
Si
ISBN/ISSN
978-1-4799-4398-2
10.1109/pvsc.2014.6925676
Start Date
08/06/2014
End Date
13/06/2014
From page
3453
To page
3456
Proc. 40th IEEE PVSC
Participants
  • Autor: Enrique Barrigon Montañes (UPM)
  • Autor: Pilar Espinet González (UPM)
  • Autor: Y. Contreras
  • Autor: Laura Barrutia Poncela (UPM)
  • Autor: Ignacio Rey-Stolle Prado (UPM)
  • Autor: Carlos Algora Del Valle (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Semiconductores III-V
  • Departamento: Electrónica Física
S2i 2020 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)