Memorias de investigación
Ponencias en congresos:
A tool for the automatic analysis of single events effects on electronic circuits
Año:2014
Áreas de investigación
  • Nanoelectrónica,
  • Modelado eléctrico de circuitos integrados
Datos
Descripción
Nowadays integrated circuit reliability is challenged by both variability and working conditions. Environmental radiation has become a major issue when ensuring the circuit correct behavior. The required radiation and later analysis performed to the circuit boards is both fund and time expensive. The lack of tools which support pre-manufacturing radiation hardness analysis hinders circuit designers tasks. This paper describes an extensively customizable simulation tool for the characterization of radiation effects on electronic systems. The proposed tool can produce an in depth analysis of a complete circuit in almost any kind of radiation environment in affordable computation times.
Internacional
Si
Nombre congreso
CMOS Variability (VARI), 2014 5th European Workshop on
Tipo de participación
960
Lugar del congreso
Palma de Mallorca
Revisores
Si
ISBN o ISSN
978-1-4799-5399-8
DOI
10.1109/VARI.2014.6957082
Fecha inicio congreso
29/09/2014
Fecha fin congreso
01/10/2014
Desde la página
1
Hasta la página
6
Título de las actas
CMOS Variability (VARI), 2014 5th European Workshop on
Esta actividad pertenece a memorias de investigación
Participantes
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Laboratorio de Sistemas Integrados (LSI)
  • Departamento: Ingeniería Electrónica