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Memorias de investigación
Communications at congresses:
A tool for the automatic analysis of single events effects on electronic circuits
Year:2014
Research Areas
  • Nanoelectronics,
  • Modelate electric of integrate circuit
Information
Abstract
Nowadays integrated circuit reliability is challenged by both variability and working conditions. Environmental radiation has become a major issue when ensuring the circuit correct behavior. The required radiation and later analysis performed to the circuit boards is both fund and time expensive. The lack of tools which support pre-manufacturing radiation hardness analysis hinders circuit designers tasks. This paper describes an extensively customizable simulation tool for the characterization of radiation effects on electronic systems. The proposed tool can produce an in depth analysis of a complete circuit in almost any kind of radiation environment in affordable computation times.
International
Si
Congress
CMOS Variability (VARI), 2014 5th European Workshop on
960
Place
Palma de Mallorca
Reviewers
Si
ISBN/ISSN
978-1-4799-5399-8
10.1109/VARI.2014.6957082
Start Date
29/09/2014
End Date
01/10/2014
From page
1
To page
6
CMOS Variability (VARI), 2014 5th European Workshop on
Participants
  • Autor: Fernando Garcia Redondo (UPM)
  • Autor: M. Luisa Lopez Vallejo (UPM)
  • Autor: Pablo Royer Del Barrio (UPM)
  • Autor: Javier Agustin Saenz (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Laboratorio de Sistemas Integrados (LSI)
  • Departamento: Ingeniería Electrónica
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