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Descripción
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| Confocal Raman spectroscopy coupled with an atomic force microscopy (AFM) study is carried out in conductive films of carbon black-silica obtained by the sol-gel process. The thin films are nanocomposites that consist of low graphitized carbon black nanoparticles (CB) forming agglomerates in a silica matrix obtained by the sol-gel process. High spatial resolution Raman images in both the surface and the depth profile are obtained by using confocal Raman microscopy in which the topographic information provided by the coupled AFM technique became relevant. The nanostructure is resolved by analyzing both the Raman intensity and the Raman shift of the carbon modes. From these results it can be concluded that increasing the sintering temperature produces microstructural changes that induce a Raman shift to higher wavenumbers (blue-shift) of the ordered phase (G peak). This blue Raman shift is higher in the regions where the CB is bound by the silica matrix as a consequence of interface interactions. The structural resolution followed by confocal Raman microscopy coupled with atomic force microscopy is an interesting experimental procedure for obtaining a detailed analysis of the nanocomposite thin-film structure. | |
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Internacional
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Si |
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JCR del ISI
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Si |
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Título de la revista
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Journal of Physical Chemistry C |
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ISSN
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1932-7447 |
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Factor de impacto JCR
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4,835 |
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Información de impacto
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Volumen
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118 |
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DOI
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10.1021/jp502403r |
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Número de revista
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19 |
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Desde la página
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10488 |
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Hasta la página
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10494 |
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Mes
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SIN MES |
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Ranking
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Q1 |