Observatorio de I+D+i UPM

Memorias de investigación
Research Publications in journals:
Semi-quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers
Year:2015
Research Areas
  • Solar cells,
  • Technology of devices for engineering
Information
Abstract
An adequate qualification of concentrator photovoltaic solar cells and cell-on-carriers is essential to increase their industrial development. The lack of qualification tests for measuring their reliability together with the fact that conventional accelerated life tests are laborious and time consuming are open issues. Accordingly, in this paper, we propose a semi-quantitative temperature-accelerated life test to qualify solar cells and cell-on-carriers that can assure a minimum life when failure mechanisms are accelerated by temperature under emulated nominal working conditions with an activation energy >0.9?eV. A properly designed semi-quantitative accelerated life test should be able to determine if the device under test will satisfy its reliability requirements with an acceptable uncertainty level. The applicability, procedure, and design of the proposed test are detailed in the paper.
International
Si
JCR
Si
Title
Progress in Photovoltaics
ISBN
1062-7995
Impact factor JCR
9,696
Impact info
Volume
23
10.1002/pip.2631
Journal number
12
From page
1857
To page
1866
Month
SIN MES
Ranking
Participants
  • Autor: Neftali Nuñez Mendoza (UPM)
  • Autor: Manuel Vazquez Lopez (UPM)
  • Autor: Vincenzo Orlando (UPM)
  • Autor: P. Espinet-González
  • Autor: Carlos Algora Del Valle (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Semiconductores III-V
  • Departamento: Electrónica Física
  • Centro o Instituto I+D+i: Instituto de Energía Solar
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Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
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