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Memorias de investigación
Communications at congresses:
Reliable Design Methodology: The Combined Effect of Radiation, Variability and Temperature
Year:2016
Research Areas
  • Electronic technology and of the communications
Information
Abstract
The effects caused by variability, temperature, radiation or aging may compromise the reliability of electronic circuits. Circuits designers must consider their combined effects early during the design cycle, even though it is a time and effort demanding task. In this work we present a methodology and simulation framework for the reliable design of circuits working under realistic conditions such as a wide range of temperatures, radiation and process variations. This proposal provides an alternative method for validating digital and analog circuits. Depending on the analyzed circuit functionality, the user is able to define complex reliability metrics such as signal upsets, delays or frequency deviations to measure the circuit response in affordable simulation time.
International
Si
Congress
Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016 13th International Conference on
960
Place
Lisboa
Reviewers
Si
ISBN/ISSN
978-1-5090-0490-4
10.1109/SMACD.2016.7520646
Start Date
27/06/2016
End Date
30/06/2016
From page
0
To page
1
Reliable design methodology: The combined effect of radiation, variability and temperature
Participants
  • Autor: Fernando Garcia Redondo (UPM)
  • Autor: M. Luisa Lopez Vallejo (UPM)
  • Autor: Hernan Aparicio Cerqueira (UPM)
  • Autor: Pablo Ituero Herrero (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Laboratorio de Sistemas Integrados (LSI)
  • Centro o Instituto I+D+i: Centro de I+d+i en Procesado de la Información y Telecomunicaciones
  • Departamento: Ingeniería Electrónica
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