Observatorio de I+D+i UPM

Memorias de investigación
Research Publications in journals:
Uncertainty analysis for non-uniform residual stresses determined by the hole drilling strain gauge method
Year:2016
Research Areas
  • Engineering
Information
Abstract
Due to its simplicity and low cost, the hole drilling strain gauge method is one of the most popular techniques to determine residual stresses. The Standard ASTM E837-13 distinguish between constant and variable stresses in depth. Each type of measurement has an associated uncertainty. The goal should be the quantification and reduction in its magnitude to be acceptable for the purposes of the measurement. Uncertainty estimation associated with this method has not been addressed in depth. The present work deals with uncertainty calculation in the determination of non-uniform residual stresses by the integral method. A general estimation procedure by Monte Carlo method, where many uncertainty sources have been considered, is presented. In normal experiment condition, most of these sources are significant and the irrelevant ones have been identified. Monte Carlo method verifies that a measurement uncertainty evaluation with the GUM uncertainty framework can be performed.
International
Si
JCR
Si
Title
Measurement
ISBN
0263-2241
Impact factor JCR
Impact info
Volume
97
10.1016/j.measurement.2016.11.010
Journal number
From page
51
To page
63
Month
NOVIEMBRE
Ranking
Participants
  • Autor: David Peral Jimenez (UPM)
  • Autor: Jesus de Vicente Y Oliva (UPM)
  • Autor: Juan Antonio Porro Gonzalez (UPM)
  • Autor: Jose Luis Ocaña Moreno (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Grupo de Investigación en Ingeniería y Aplicaciones del Láser
  • Departamento: Física Aplicada e Ingeniería de Materiales
S2i 2019 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)