Descripción
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This paper presents the evolution in the strategy to assess the reliability of III-V solar cells and a new thermal ageing test carried out over GaAs single junction solar cells at three different temperatures (130, 150 and 170ºC). The perimeter of the solar cells has been protected with silicone, which seems to be an effective way of enhancing the reliability of the solar cells. A preliminary analysis of the results indicates a mean time to failure (MTTF) one order of magnitude larger than the one obtained in a previous thermal test with the perimeter uncoated. | |
Internacional
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Si |
Nombre congreso
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6th International Conference on Concentrating Photovoltaic Systems |
Tipo de participación
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960 |
Lugar del congreso
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Friburgo (Alemania) |
Revisores
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Si |
ISBN o ISSN
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978-0-7354-0827-2 |
DOI
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Fecha inicio congreso
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07/04/2010 |
Fecha fin congreso
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09/04/2010 |
Desde la página
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221 |
Hasta la página
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224 |
Título de las actas
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6th International Conference on Concentrating Photovoltaic Systems |