Observatorio de I+D+i UPM

Memorias de investigación
Communications at congresses:
PREDICTION OF DESTRUCTIVE PROPERTIES USING DESCRIPTIVE ANALYSIS OF ND MEASUREMENTS
Year:2010
Research Areas
  • Agriculture
Information
Abstract
Three groups of measurements related to peach maturity were acquired through destructive (D) mechanical tests (Magness Taylor Firmness, MTF), mechanical non destructive (ND) tests, and ND optical spectroscopy (Optical indexes). The relationship between these groups of variables was studied in order to estimate D mechanical measurements (MTF, with higher instrumental and sampling variability, time consuming, generally used as a reference for the assessment of peach handling), from ND measurements (quick, applicable on line, dealing better with the high variability found in fruit products). Multivariate exploratory analysis was used to extract the structure of the data. The information about the data structure of ND measurements, the relationship of MTF with the space defined by ND variables, and the expert knowledge regarding to the dataset was then used for modelling MTF (R2=0.72 and standard error on validation 5.73 N).poster PO1-54
International
No
Congress
VII Colloquium Chemiometricum Mediterraneum CCM VII
960
Place
Granada
Reviewers
Si
ISBN/ISSN
978-84-937483-4-0
Start Date
21/06/2010
End Date
24/06/2010
From page
54
To page
60
e-PROCEEDINGS BOOK
Participants
  • Autor: Lourdes Lleo Garcia (UPM)
  • Participante: Jean-Michel Roger (Cemagref-Franca)
  • Autor: Ana Herrero Langreo (UPM)
  • Participante: Elvira Fernández-Ahumada (Cemagref-France)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: LPF-TAGRALIA: Técnicas Avanzadas en Agroalimentación
  • Departamento: Ciencia y Tecnología Aplicadas a la Ingeniería Técnica Agrícola
S2i 2019 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)