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Descripción
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| Recently, X-parameters have been introduced to model device non-linear behavior. In addition to providing a measurement-based tool to numerically predict non-linear in-band device behavior in CAD, they can also provide the designer of non-linear circuits the ability to improve the knowledge of the out-of-band device behavior. Exploiting this crucial design aspect, this work presents a novel measurement setup which enables small-signal X-parameters measurements, of non-linear devices driven by a large-signal tone at a frequency fc, in order to predict out-of-band performance at the perturbation frequency, fx, used for small-signal X-parameters extraction. | |
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Internacional
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Si |
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Nombre congreso
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European Microwave Conference, EuMC 2012, |
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Tipo de participación
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960 |
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Lugar del congreso
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Ámsterdam, Holanda |
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Revisores
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ISBN o ISSN
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DOI
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Fecha inicio congreso
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28/10/2012 |
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Fecha fin congreso
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02/11/2012 |
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