Memorias de investigación
Communications at congresses:
Analysis of the Mechanical Properties of Multicrystalline and Monocrystalline Silicon Wafers Manufactured by Casting Methods
Year:2011
Research Areas
  • Engineering,
  • Electronic technology and of the communications,
  • Mechanical engineering
Information
Abstract
Quasi-monocrystalline silicon wafers have appeared as a critical innovation in the PV industry, joining the most favourable characteristics of the conventional substrates: the higher solar cell efficiencies of monocrystalline Czochralski-Si (Cz-Si) wafers and the lower cost and the full square-shape of the multicrystalline ones. However, the quasi-mono ingot growth can lead to a different defect structure than the typical Cz-Si process. Thus, the properties of the brand-new quasi-mono wafers, from a mechanical point of view, have been for the first time studied, comparing their strength with that of both Cz-Si mono and typical multicrystalline materials. The study has been carried out employing the four line bending test and simulating them by means of FE models. For the analysis, failure stresses were fitted to a three-parameter Weibull distribution. High mechanical strength was found in all the cases. The low quality quasi-mono wafers, interestingly, did not exhibit critical strength values for the PV industry, despite their noticeable density of extended defects.
International
Si
Congress
5th International Workshop on Science and Technology of Crystalline Silicon Solar Cells (CSSC-5)
960
Place
Boston, USA
Reviewers
Si
ISBN/ISSN
00-0000-000-0
Start Date
01/11/2011
End Date
03/11/2011
From page
0
To page
0
Poster en Workshop
Participants
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Ingeniería Sísmica: Dinámica de Suelos y Estructuras
  • Departamento: Mecánica Estructural y Construcciones Industriales