Research Publications in journals:
Ionoluminescence as Sensor of Structural Disorder in Crystalline SiO2:Determination of Amorphization Threshold by Swift Heavy Ions
Year:2012
Research Areas
- Engineering
Information
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Abstract
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| Ionoluminescence (IL) has been used in this work as a sensitive tool to probe the microscopic electronic processes and structural changes produced on quartz by the irradiation with swift heavy ions. The IL yields have been measured as a function of irradiation fluence and electronic stopping power. The results are consistent with the assignment of the 2.7 eV (460 nm) band to the recombination of self-trapped excitons at the damaged regions in the irradiated material. Moreover, it was possible to determine the threshold for amorphization by a single ion impact, as ?1:7 keV/nm, which agrees well with the results of previous studies | |
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International
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Si |
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JCR
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Si |
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Title
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Applied Physics Express |
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ISBN
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1882-0786 |
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Impact factor JCR
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Impact info
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Volume
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5 |
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10.1143/APEX.5.011101 |
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Journal number
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From page
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011101 |
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To page
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011101 |
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Month
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SIN MES |
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Ranking
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Open Access publication
Participants
- Autor: Ovidio Yordanis Peña Rodriguez UPM
- Autor: D. Jiménez-Rey Centro de Microana¿ lisis de Materiales
- Autor: J. Manzano-Santamaría EURATOM CIEMAT
- Autor: J. Olivares Centro de Microana¿ lisis de Materiales
- Autor: A. Muñoz Centro de Microanalisis de Materiales
- Autor: Antonio Juan Rivera de Mena UPM
- Autor: F. Agulló-López Centro de Microana¿ lisis de Materiales
Research Group, Departaments and Institutes related
- Creador: Grupo de Investigación: Fusión Nuclear Inercial y Tecnología de fusión
- Departamento: Ingeniería Nuclear
- Centro o Instituto I+D+i: Instituto de Fusión Nuclear