Abstract
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A comparative study on inorganic alignment layers and their microstructure has been carried out, focusing specifically on SiOx and SiO2. The aim was to establish a relationship between layer microstructure and liquid crystal alignment. | |
International
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Si |
Congress
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20TH CONFERENCE ON LIQUID CRYSTALS |
|
960 |
Place
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MIKOLAJKI, POLAND |
Reviewers
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Si |
ISBN/ISSN
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0000-0000 |
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Start Date
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15/09/2013 |
End Date
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20/09/2013 |
From page
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1 |
To page
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1 |
|
20TH CONFERENCE ON LIQUID CRYSTALS (CHEMISTRY, PHYSICS & APPLICATIONS) |