|
Descripción
|
|
|---|---|
| We have fabricated and characterized a lattice of submicron cone-shaped holes on a SiO2/Si wafer. Reflectivity profiles as a function of angle of incidence and polarization, phase shift and spectrometry are obtained for several fluids with different refractive indexes filling the holes. The optical setup allows measuring in the center of a single hole and collecting all data simultaneously, which can be applied for measuring extremely low volumes of fluid (in the order of 0.1 femtolitres) and label-free immunoassays, as it works as a refractive index sensor. A three layer film stack model is defined to perform theoretical calculations. | |
|
Internacional
|
Si |
|
JCR del ISI
|
Si |
|
Título de la revista
|
OPT EXPRESS |
|
ISSN
|
1094-4087 |
|
Factor de impacto JCR
|
3,709 |
|
Información de impacto
|
|
|
Volumen
|
15 |
|
DOI
|
|
|
Número de revista
|
0 |
|
Desde la página
|
|
|
Hasta la página
|
|
|
Mes
|
SIN MES |
|
Ranking
|
|