Research Publications in journals:
Module optical analyzer: Identification of defects on the production line
Year:2014
Research Areas
- Materials for electric engineering and electronics,
- Technologies of integration for engineering and electronics,
- Solar cells
Information
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Abstract
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| The usefulness of the module optical analyzer when identifying module defects on production line is presented in this paper. Two different case studies performed with two different kind of CPV modules are presented to show the use of MOA both in IES-UPM and Daido Steel facilities. | |
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International
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JCR
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No |
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Title
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AIP Conference Proceedings |
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ISBN
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0094-243X |
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Impact factor JCR
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Impact info
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Volume
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1616 |
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10.1063/1.4897042 |
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Journal number
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From page
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119 |
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To page
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123 |
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Month
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SIN MES |
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Ranking
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Open Access publication
Participants
- Autor: Rebeca Herrero Martin UPM
- Autor: Stephen Askins . UPM
- Autor: Ignacio Anton Hernandez UPM
- Autor: Gabriel Sala Pano UPM
- Autor: K. Araki
- Autor: H. Nagai
Research Group, Departaments and Institutes related
- Creador: Centro o Instituto I+D+i: Instituto de Energía Solar
- Departamento: Electrónica Física
- Departamento: Ingeniería Telemática y Electrónica