Memorias de investigación
Research Publications in journals:
Defect Detection from Multi-frequency Limited Data via Topological Sensitivity
Year:2016

Research Areas

Information
Abstract
0
International
Si
JCR
Si
Title
JOURNAL OF MATHEMATICAL IMAGING AND VISION
ISBN
0924-9907
Impact factor JCR
1,552
Impact info
Volume
55
10.1007/s10851-015-0611-y
Journal number
1
From page
19
To page
35
Month
Ranking
0
Participants

Research Group, Departaments and Institutes related
  • Grupo de Investigación: Dinámica y estabilidad no lineal en ingeniería aeroespacial
  • Departamento: Matemática Aplicada a la Ingeniería Aeroespacial