Observatorio de I+D+i UPM

Descripción
?Systems based on Xilinx Virtex series FPGAs can benefit, compared to traditional rad-hard technologies, from high performance, high logic density and dynamic reconfiguration capability. However, the underlying SRAM technology is sensitive to ionizing radiation, which can induce faults that must be managed to improve system?s dependability. This paper proposes a Dual-Layer Fault Manager concept, which aims at managing both configuration and application faults, dynamically balancing redundancy level, dependability and functionality. This concept has been prototyped and its initial test results are discussed.
Internacional	Si
Nombre congreso	Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on
Tipo de participación	960
Lugar del congreso	Amherst, MA, EEUU
Revisores	Si
ISBN o ISSN	978-1-4799-8606-4
DOI
Fecha inicio congreso	12/10/2015
Fecha fin congreso	14/10/2015
Desde la página	72
Hasta la página	75
Título de las actas	Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on

Esta actividad pertenece a memorias de investigación

• Autor: M. Luisa Lopez Vallejo (UPM)

• Creador: Grupo de Investigación: Laboratorio de Sistemas Integrados (LSI)
• Departamento: Ingeniería Electrónica