Observatorio de I+D+i UPM

Memorias de investigación
Ponencias en congresos:
Characterization of analog modules: Reliability analyses of radiation, temperature and variations effects
Año:2016
Áreas de investigación
  • Tecnología electrónica y de las comunicaciones
Datos
Descripción
Nowadays the uncertainties produced by the combined effect of PVT Variations together with radiation dramatically compromises electronic systems behavior. Usually, radiation effects are studied from a digital point of view, analyzing upset error ratios and their consequences. In this work we redefine the analysis methodology of combined effects of multiple error sources that may affect analog circuits. For this purpose, we use an ad-hoc reliability simulation framework, that comes as a CAD solution for circuit designers which require an alternative method for validating the circuit instead of the time and cost consuming radiation tests. Developed on top of a SPICE-level simulator and a radiation model library which allows not only most CMOS radiation schemes but also predictive technologies and emerging devices to be used during the multi-parameter analysis. We applied the framework and related methodology to the characterization of a bandgap voltage reference, completely identifying its reliability properties when working on a wide temperature range and radiation environments.
Internacional
Si
Nombre congreso
Design of Circuits and Integrated Systems (DCIS), 2016 Conference on
Tipo de participación
960
Lugar del congreso
Granada
Revisores
Si
ISBN o ISSN
978-1-5090-4565-5
DOI
10.1109/DCIS.2016.7845361
Fecha inicio congreso
23/11/2016
Fecha fin congreso
25/11/2016
Desde la página
0
Hasta la página
1
Título de las actas
Characterization of analog modules: Reliability analyses of radiation, temperature and variations effects
Esta actividad pertenece a memorias de investigación
Participantes
  • Autor: Fernando Garcia Redondo (UPM)
  • Autor: Hernan Aparicio Cerqueira (UPM)
  • Autor: M. Luisa Lopez Vallejo (UPM)
  • Autor: Pablo Ituero Herrero (UPM)
  • Autor: Carlos Alberto Lopez Barrio (UPM)
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Laboratorio de Sistemas Integrados (LSI)
  • Centro o Instituto I+D+i: Centro de I+d+i en Procesado de la Información y Telecomunicaciones
  • Departamento: Ingeniería Electrónica
S2i 2021 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)