|
Abstract
|
|
|---|---|
| Testing of large (high-gain) satellite antennas as well as that of small integrated antennas at millimetre and submillimetre wavelengths is a difficult task. In case of large antennas, the classical far-field method has two major obstacles at mm and submm wavelengths: impractically large measurement distance and high atmospheric loss. The planar near-field scanning method has been used up to 1 THz. The applied near-field methods give useful information only on the main beam and its vicinity, because the field-sampling is typically very sparse. Reflector-based compact antenna test range (CATR) measurements have been carried out up to 500 GHz. Hologram-based CATR measurements have been carried out at 650 GHz. In case of small integrated antennas, various techniques for on-wafer measurements have been developed. This short course discusses the techniques and limitations of the various test methods, such as the planar near-field scanning and CATR as well as on-wafer measurements. Also antenna pattern correction techniques are discussed. Lectures are accompanied by laboratory demonstrations/exercises. The participants have a choice to study a related specific topic prior to the short course, write a brief report and present that to other participants during the course. | |
|
International
|
Si |
|
Congress
|
Antenna measurements at millimetre and submillimetre wavelengths |
|
Entity
|
European School of Antennas |
|
Entity Nationality
|
Sin nacionalidad |
|
Place
|
Aalto University School of Electrical Engineering, |
|
Start Date
|
08/05/2017 |
|
End Date
|
12/05/2017 |