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Descripción
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| Testing of large (high-gain) satellite antennas as well as that of small integrated antennas at millimetre and submillimetre wavelengths is a difficult task. In case of large antennas, the classical far-field method has two major obstacles at mm and submm wavelengths: impractically large measurement distance and high atmospheric loss. The planar near-field scanning method has been used up to 1 THz. The applied near-field methods give useful information only on the main beam and its vicinity, because the field-sampling is typically very sparse. Reflector-based compact antenna test range (CATR) measurements have been carried out up to 500 GHz. Hologram-based CATR measurements have been carried out at 650 GHz. In case of small integrated antennas, various techniques for on-wafer measurements have been developed. This short course discusses the techniques and limitations of the various test methods, such as the planar near-field scanning and CATR as well as on-wafer measurements. Also antenna pattern correction techniques are discussed. Lectures are accompanied by laboratory demonstrations/exercises. The participants have a choice to study a related specific topic prior to the short course, write a brief report and present that to other participants during the course. | |
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Internacional
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Si |
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Nombre congreso
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Antenna measurements at millimetre and submillimetre wavelengths |
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Entidad organizadora
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European School of Antennas |
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Nacionalidad Entidad
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Sin nacionalidad |
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Lugar/Ciudad de impartición
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Aalto University School of Electrical Engineering, |
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Fecha inicio
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08/05/2017 |
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Fecha fin
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12/05/2017 |