Observatorio de I+D+i UPM

Memorias de investigación
Capítulo de libro:
OOPS!: A Pitfall-Based System for Ontology Diagnosis
Año:2018
Áreas de investigación
  • Ciencias de la computación y tecnología informática
Datos
Descripción
The first contribution of this paper consists on a live catalogue of pitfalls that extends previous works on modeling errors with pitfalls resulting from an empirical analysis of numerous ontologies. Such a catalogue classifies pitfalls according to the Structural, Functional and Usability-Profiling dimensions. For each pitfall, we include the value of its importance level (critical, important and minor). The second contribution is the description of OntOlogy Pitfall Scanner (OOPS!), a widely used tool for detecting pitfalls in ontologies and targeted at newcomers and domain experts unfamiliar with description logics and ontology implementation languages. The tool operates independently of any ontology development platform and is available through a web application and a web service. The evaluation of the system is provided both through a survey of users' satisfaction and worldwide usage statistics. In addition, the system is also compared with existing ontology evaluation tools in terms of coverage of pitfalls detecte
Internacional
Si
DOI
Edición del Libro
Editorial del Libro
IGI Global
ISBN
9781522550426
Serie
Título del Libro
Innovations, Developments, and Applications of Semantic Web and Information Systems
Desde página
120
Hasta página
148
Esta actividad pertenece a memorias de investigación
Participantes
  • Autor: Maria Poveda Villalon (UPM)
  • Autor: Asuncion de Maria Gomez Perez (UPM)
  • Autor: M. Carmen Suarez de Figueroa Baonza (UPM)
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Ontology Engineering Group
  • Departamento: Inteligencia Artificial
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