Memorias de investigación
Communications at congresses:
Semiconductor parameter extraction via current-voltage characterization and Bauesian inference methods
Year:2018
Research Areas
  • Engineering
Information
Abstract
Defects in semiconductors, although atomistic in scale and often scarce in concentration, frequently represent the performance-limiting factor in optoelectronic devices such as solar cells. However, due to this scale and scarcity, direct experimental characterization of defects is technically challenging, timeconsuming, and expensive. Even so, the fact that defects can limit device performance suggests that device-level characterization should be able to lend insight into their properties. In this work, we use Bayesian inference to demonstrate a way to relate experimental device measurements with defect properties (as well as other materials properties affected by the presence of defects, such as minority-carrier lifetime).
International
Si
Congress
IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)
960
Place
Waikoloa (USA)
Reviewers
Si
ISBN/ISSN
978-1-5386-8530-3
Start Date
10/06/2018
End Date
15/06/2018
From page
3271
To page
3275
Proceedings of IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)
Participants
  • Autor: R.C. Kurchin
  • Autor: J.R. Poindexter
  • Autor: D. Kitchaev
  • Autor: V. Vahanissi
  • Autor: Carlos del Cañizo Nadal UPM
  • Autor: L. Zhe
  • Autor: H.S. Laine
  • Autor: C. Roat
  • Autor: S. Levcenco
  • Autor: G. Ceder
  • Autor: T. Buonassisi
Research Group, Departaments and Institutes related
  • Creador: Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física